A typical part of an initial engagement is to demonstrate that we can solve your problem or add value through modeling and exploration. This is referred to as a Proof of Concept (POC). A typical POC would demonstrate yield improvement by leveraging your dataset. Or more specifically, targeting a parameter that has a high impact on yield, such as Wafer-to-Wafer-Nonuniformity, defects, or parametrics such as gate leakage or current. After gaining access to your dataset, we would explore various model and feature-set-organization approaches. Once a successful approach is identified, we would present to you how the POC demonstrates that the approach will be successful in implementation.